STN EN 60749-23 (358799)

Semiconductor devices – Mechanical and climatic test methods Part 23: High temperature operating life

STANDARD published on 1.10.2004

Language
Format	Print design - ON REQUEST
Availability	The sale has ended
Price	ONREQUEST excl. VAT
ON REQUEST
	Order including changes

The information about the standard:

Designation standards: STN EN 60749-23
Classification mark: 358799
Catalog number: 96505
Publication date standards: 1.10.2004
SKU: NS-528311
The number of pages: 29
Approximate weight : 87 g (0.19 lbs)
Country: Slovak technical standard
Category: Technical standards STN

We recommend simillar standard:!

ČSN EN 60749-23 (01.12.2004)

The category - similar standards:

Semiconductor devices in general

These changes apply to this standard:

STN EN 60749-23:2004/A1 (358799) Change

Change published on 1.6.2011

We recommend simillar standard:!
ČSN EN 60749-23:2004/A1 (01.11.2011)

Selected format:

English -

Print design (ON REQUEST)

Show all technical information.

ON REQUEST

The sale has ended

1.9.2009

1.12.2011

1.1.2004

1.10.2004

1.3.2004

WITHDRAWN
1.5.2007

Updating of laws

Do you want to be sure about the validity of used regulations?
We offer you a solution so that you could use valid and updated legislative regulations.
Would you like to get more information? Look at this page.

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.