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  4. Standard "STN EN 60749-40"
Standard STN EN 60749-40 1.12.2011 preview

STN EN 60749-40 (358799)

Polovodičové súčiastky. Mechanické a klimatické skúšobné metódy. Časť 40: Skúšobná metóda pádom osadenej dosky s použitím tenzometra (Norma na priame používanie ako STN).

Automatically translated name:

Semiconductor devices. Mechanical and climatic test methods. Part 40: Test method for dropping the seeded plates using a tensiometer (IEC STN).



STANDARD published on 1.12.2011


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The information about the standard:

Designation standards: STN EN 60749-40
Classification mark: 358799
Catalog number: 114455
Publication date standards: 1.12.2011
SKU: NS-528335
Approximate weight : 30 g (0.07 lbs)
Country: Slovak technical standard
Category: Technical standards STN

We recommend simillar standard:!

ČSN EN 60749-40 (01.03.2012)

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The category - similar standards:

Semiconductor devices in general

Similar standards:

STN EN 60191-6-18STN EN 60191-6-18..

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STN EN 60191-6-19STN EN 60191-6-19..

1.10.2010

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STN EN 60191-6-21STN EN 60191-6-21..

1.2.2011

STN EN 60191-6-22STN EN 60191-6-22..

1.9.2013

STN EN 60749STN EN 60749

WITHDRAWN
1.8.2001

Latest update: 2025-12-14 (Number of items: 2 251 062)
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