Standard STN EN 60749-40 1.12.2011 preview

STN EN 60749-40 (358799)

Polovodičové súčiastky. Mechanické a klimatické skúšobné metódy. Časť 40: Skúšobná metóda pádom osadenej dosky s použitím tenzometra (Norma na priame používanie ako STN).

Automatically translated name:

Semiconductor devices. Mechanical and climatic test methods. Part 40: Test method for dropping the seeded plates using a tensiometer (IEC STN).



STANDARD published on 1.12.2011


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The information about the standard:

Designation standards: STN EN 60749-40
Classification mark: 358799
Catalog number: 114455
Publication date standards: 1.12.2011
SKU: NS-528335
Approximate weight : 30 g (0.07 lbs)
Country: Slovak technical standard
Category: Technical standards STN

We recommend simillar standard:!

ČSN EN 60749-40 (01.03.2012)

The category - similar standards:

Semiconductor devices in general

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