WITHDRAWN STN EN 62047-15 1.12.2015 preview

STN EN 62047-15 (358792)

Semiconductor devices - Micro-electromechanical devices - Part 15: Test method of bonding strength between PDMS and glass

Automatically translated name:

Semiconductor devices. Electromechanical micro devices. Part 15: Test method for shear strength between PDMS and glass (IEC STN ).



STANDARD published on 1.12.2015


Format
AvailabilityThe sale has ended
PriceONREQUEST excl. VAT
ON REQUEST

The information about the standard:

Designation standards: STN EN 62047-15
Classification mark: 358792
Catalog number: 121887
Note: WITHDRAWN
Publication date standards: 1.12.2015
SKU: NS-621878
Approximate weight : 30 g (0.07 lbs)
Country: Slovak technical standard
Category: Technical standards STN

We recommend simillar standard:!

ČSN EN 62047-15 (01.09.2015)

We recommend:

Technical standards updating

Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.

Would you like to know more? Look at this page.




Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.