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Semiconductor devices - Micro-electromechanical devices - Part 15: Test method of bonding strength between PDMS and glass
Automatically translated name:
Semiconductor devices. Electromechanical micro devices. Part 15: Test method for shear strength between PDMS and glass (IEC STN ).
STANDARD published on 1.12.2015
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Designation standards: STN EN 62047-15
Classification mark: 358792
Catalog number: 121887
Note: WITHDRAWN
Publication date standards: 1.12.2015
SKU: NS-621878
Approximate weight : 30 g (0.07 lbs)
Country: Slovak technical standard
Category: Technical standards STN
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