Standard STN EN IEC 63616 1.4.2026 preview

STN EN IEC 63616 (353817)

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method

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STANDARD published on 1.4.2026


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The information about the standard:

Designation standards: STN EN IEC 63616
Classification mark: 353817
Catalog number: 142231
Publication date standards: 1.4.2026
SKU: NS-1265670
Approximate weight : 30 g (0.07 lbs)
Country: Slovak technical standard
Category: Technical standards STN

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ČSN EN IEC 63616 (01.06.2026)

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