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Semiconductor devices - Mechanical and climatic test methods -- Part 1: General
Automatically translated name:
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS -- PART 1: GENERAL
STANDARD published on 28.5.2004
Designation standards: UNE-EN 60749-1:2004
Publication date standards: 28.5.2004
SKU: NS-560985
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: Spanish technical standard
Category: Technical standards UNE
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28.5.2004
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