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  4. Standard "UNE-EN 60749-10:2003"
WITHDRAWN UNE-EN 60749-10:2003 30.5.2003 preview

UNE-EN 60749-10:2003

Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock.

Automatically translated name:

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS -- PART 10: MECHANICAL SHOCK.



STANDARD published on 30.5.2003


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48.00 USD

The information about the standard:

Designation standards: UNE-EN 60749-10:2003
Note: WITHDRAWN
Publication date standards: 30.5.2003
SKU: NS-560986
The number of pages: 15
Approximate weight : 45 g (0.10 lbs)
Country: Spanish technical standard
Category: Technical standards UNE

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