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  4. Standard "UNE-EN 60749-17:2003"
WITHDRAWN UNE-EN 60749-17:2003 21.11.2003 preview

UNE-EN 60749-17:2003

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Automatically translated name:

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS -- PART 17: NEUTRON IRRADIATION



STANDARD published on 21.11.2003


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40.70 USD

The information about the standard:

Designation standards: UNE-EN 60749-17:2003
Note: WITHDRAWN
Publication date standards: 21.11.2003
SKU: NS-560993
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: Spanish technical standard
Category: Technical standards UNE

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