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Semiconductor devices - Mechanical and climatic test methods -- Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
Translate name
STANDARD published on 11.6.2004
Designation standards: UNE-EN 60749-20:2004
Note: WITHDRAWN
Publication date standards: 11.6.2004
SKU: NS-1118052
The number of pages: 57
Approximate weight : 171 g (0.38 lbs)
Country: Spanish technical standard
Category: Technical standards UNE
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