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UNE-EN 60749-27:2006
Semiconductor devices - Mechanical and climatic test methods -- Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006) (Endorsed by AENOR in November of 2006.)
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STANDARD published on 1.11.2006
The information about the standard:
Designation standards: UNE-EN 60749-27:2006
Publication date standards: 1.11.2006
SKU: NS-1118060
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: Spanish technical standard
Category: Technical standards UNE
The category - similar standards:
These changes apply to this standard:
UNE-EN 60749-27:2006/A1:2012
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Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.)
Change published on 1.1.2013
Selected format:Show all technical information.
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