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  4. Standard "UNE-EN 60749-29:2004"
WITHDRAWN UNE-EN 60749-29:2004 9.7.2004 preview

UNE-EN 60749-29:2004

Semiconductor devices - Mechanical and climatic test methods -- Part 29: Latch-up test

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STANDARD published on 9.7.2004


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78.80 USD

The information about the standard:

Designation standards: UNE-EN 60749-29:2004
Note: WITHDRAWN
Publication date standards: 9.7.2004
SKU: NS-1118062
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: Spanish technical standard
Category: Technical standards UNE

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