We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (Endorsed by Asociación Espanola de Normalización in July of 2017.)
Translate name
STANDARD published on 1.7.2017
Designation standards: UNE-EN 60749-3:2017
Publication date standards: 1.7.2017
SKU: NS-1118064
The number of pages: 21
Approximate weight : 63 g (0.14 lbs)
Country: Spanish technical standard
Category: Technical standards UNE
Latest update: 2026-10-02 (Number of items: 2 304 304)
© Copyright 2026 NORMSERVIS s.r.o.