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UNE-EN 60749-30:2005
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Automatically translated name:
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS -- PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING
STANDARD published on 2.11.2005
The information about the standard:
Designation standards: UNE-EN 60749-30:2005
Note: WITHDRAWN
Publication date standards: 2.11.2005
SKU: NS-561005
The number of pages: 35
Approximate weight : 105 g (0.23 lbs)
Country: Spanish technical standard
Category: Technical standards UNE
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