UNE-EN 60749-31:2004

Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)

Automatically translated name:

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS -- PART 31: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (INTERNALLY INDUCED)

STANDARD published on 18.3.2004

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Format	electronic design (pdf) - 35.10 USD Print design - 38.60 USD
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The information about the standard:

Designation standards: UNE-EN 60749-31:2004
Publication date standards: 18.3.2004
SKU: NS-561006
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: Spanish technical standard
Category: Technical standards UNE

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