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Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
Automatically translated name:
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS -- PART 33: ACCELERATED MOISTURE RESISTANCE - UNBIASED AUTOCLAVE
STANDARD published on 16.3.2005
Designation standards: UNE-EN 60749-33:2005
Publication date standards: 16.3.2005
SKU: NS-561009
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: Spanish technical standard
Category: Technical standards UNE
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