We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Semiconductor devices - Mechanical and climatic test methods -- Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006) (Endorsed by AENOR in January of 2007.)
Translate name
STANDARD published on 1.1.2007
Designation standards: UNE-EN 60749-35:2006
Publication date standards: 1.1.2007
SKU: NS-1118066
The number of pages: 25
Approximate weight : 75 g (0.17 lbs)
Country: Spanish technical standard
Category: Technical standards UNE
Do you want to be sure about the validity of used regulations?
We offer you a solution so that you could use valid and updated legislative regulations.
Would you like to get more information? Look at this page.
Latest update: 2026-10-02 (Number of items: 2 304 304)
© Copyright 2026 NORMSERVIS s.r.o.