UNE-EN 60749-4:2003

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Automatically translated name:

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS -- PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST).

STANDARD published on 30.5.2003

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Format	electronic design (pdf) - 68.50 USD Print design - 75.40 USD
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The information about the standard:

Designation standards: UNE-EN 60749-4:2003
Note: WITHDRAWN
Publication date standards: 30.5.2003
SKU: NS-561012
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: Spanish technical standard
Category: Technical standards UNE

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