UNE-EN 60749-4:2017

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (Endorsed by Asociación Espanola de Normalización in July of 2017.)

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STANDARD published on 1.7.2017

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Format	electronic design (pdf) - 54.60 USD Print design - 60.10 USD
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The information about the standard:

Designation standards: UNE-EN 60749-4:2017
Publication date standards: 1.7.2017
SKU: NS-1118070
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: Spanish technical standard
Category: Technical standards UNE

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