We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (Endorsed by Asociación Espanola de Normalización in October of 2017.)
Translate name
STANDARD published on 10.10.2024
Designation standards: UNE-EN 60749-43:2017
Note: WITHDRAWN
Publication date standards: 10.10.2024
SKU: NS-1203590
The number of pages: 46
Approximate weight : 138 g (0.30 lbs)
Country: Spanish technical standard
Category: Technical standards UNE
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
Latest update: 2026-01-14 (Number of items: 2 254 595)
© Copyright 2026 NORMSERVIS s.r.o.