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Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (Endorsed by AENOR in December of 2011.)
Translate name
STANDARD published on 1.12.2011
Designation standards: UNE-EN 60749-7:2011
Publication date standards: 1.12.2011
SKU: NS-1118078
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: Spanish technical standard
Category: Technical standards UNE
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