Change UNE-EN 61967-6:2002/A1:2008 1.9.2008 preview

UNE-EN 61967-6:2002/A1:2008

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.)

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STANDARD published on 1.9.2008


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The information about the standard:

Designation standards: UNE-EN 61967-6:2002/A1:2008
Note: Change
Publication date standards: 1.9.2008
SKU: NS-1120392
The number of pages: 23
Approximate weight : 69 g (0.15 lbs)
Country: Spanish technical standard
Category: Technical standards UNE

The category - similar standards:

Integrated circuits. Microelectronics

This change (correction) applies to this standard:

UNE-EN 61967-6:2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.)

Standard published on 1.11.2002

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