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Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures (Endorsed by AENOR in June of 2012.)
Translate name
STANDARD published on 1.6.2012
Designation standards: UNE-EN 62047-13:2012
Publication date standards: 1.6.2012
SKU: NS-1120541
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: Spanish technical standard
Category: Technical standards UNE
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