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Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials (Endorsed by AENOR in June of 2012.)
Translate name
STANDARD published on 1.6.2012
Designation standards: UNE-EN 62047-14:2012
Publication date standards: 1.6.2012
SKU: NS-1120542
The number of pages: 21
Approximate weight : 63 g (0.14 lbs)
Country: Spanish technical standard
Category: Technical standards UNE
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