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Standard UNE-EN 62417:2010 1.9.2010 preview

UNE-EN 62417:2010

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)

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STANDARD published on 1.9.2010


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The information about the standard:

Designation standards: UNE-EN 62417:2010
Publication date standards: 1.9.2010
SKU: NS-1121001
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: Spanish technical standard
Category: Technical standards UNE

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Semiconductor devices in general

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