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Preview ASTM E428-08(2013) 1.6.2013 Preview of the standard
ASTM E428-08(2013) Historical

Standard Practice for Fabrication and Control of Metal, Other than Aluminum, Reference Blocks Used in Ultrasonic Testing (Withdrawn 2019)

WITHDRAWN published on 1.6.2013

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Preview ASTM E429-78(1991)E01 1.1.1991
ASTM E429-78(1991)E01 Historical

Test Method for Measurement and Calculation of Reflecting Characteristics of Metallic Surfaces Using Integrating Sphere Instruments (Withdrawn 1996)

WITHDRAWN published on 1.1.1991

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Preview ASTM E43-49 (1955) 1.1.1900
ASTM E43-49 (1955) Historical

Recommended Practice for Identification of Crystaline Materials by the Hanawalt X-Ray Diffraction Method (Withdrawn 1962)

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Preview ASTM E430-05 1.6.2005 Preview of the standard
ASTM E430-05 Historical

Standard Test Methods for Measurement of Gloss of High-Gloss Surfaces by Abridged Goniophotometry

WITHDRAWN published on 1.6.2005

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Preview ASTM E430-11 1.6.2011 Preview of the standard
ASTM E430-11 Historical

Standard Test Methods for Measurement of Gloss of High-Gloss Surfaces by Abridged Goniophotometry

WITHDRAWN published on 1.6.2011

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Preview ASTM E430-19 1.11.2019 Preview of the standard
ASTM E430-19 Historical

Standard Test Methods for Measurement of Gloss of High-Gloss Surfaces by Abridged Goniophotometry

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Preview ASTM E430-97 10.7.1997 Preview of the standard
ASTM E430-97 Historical

Standard Test Methods for Measurement of Gloss of High-Gloss Surfaces by Goniophotometry

WITHDRAWN published on 10.7.1997

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Preview ASTM E430-97(2003) 10.1.2003 Preview of the standard
ASTM E430-97(2003) Historical

Standard Test Methods for Measurement of Gloss of High-Gloss Surfaces by Goniophotometry

WITHDRAWN published on 10.1.2003

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Preview ASTM E431-96 10.12.1996 Preview of the standard
ASTM E431-96 Historical

Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices

WITHDRAWN published on 10.12.1996

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Preview ASTM E431-96(2002) 10.12.1996 Preview of the standard
ASTM E431-96(2002) Historical

Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices

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