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Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications
WITHDRAWN published on 10.12.1999
Selected format:Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications (Withdrawn 2020)
WITHDRAWN published on 1.6.2011
Selected format:Standard Test Methods for Oxygen Precipitation Characterization of Silicon Wafers by Measurement of Interstitial Oxygen Reduction (Withdrawn 2003)
WITHDRAWN published on 10.1.2002
Selected format:Standard Test Methods for Oxygen Precipitation Characterization of Silicon Wafers by Measurement of Interstitial Oxygen Reduction
WITHDRAWN published on 10.1.2002
Selected format:Test Method for Coincident Current Memory Core Stacks (Withdrawn 1976)
Selected format:Standard Guide for Ranking Footwear Bottom Materials on Contaminated Walkway Surfaces According to Slip Resistance Test Results
WITHDRAWN published on 10.10.2001
Selected format:Standard Guide for Ranking Footwear Bottom Materials on Contaminated Walkway Surfaces According to Slip Resistance Test Results (Withdrawn 2018)
WITHDRAWN published on 15.1.2009
Selected format:Standard Guide for Ranking Footwear Bottom Materials on Contaminated Walkway Surfaces According to Slip Resistance Test Results (Includes all amendments And changes 8/16/2017).
WITHDRAWN published on 10.10.2001
Selected format:Standard Terminology of Silicon Technology (Withdrawn 2003)
WITHDRAWN published on 10.6.2000
Selected format:Standard Specification for Cuffed and Uncuffed Tracheal Tubes (Withdrawn 2002) (Includes all amendments And changes 8/16/2017).
WITHDRAWN published on 1.1.1996
Selected format:Latest update: 2026-08-21 (Number of items: 2 298 377)
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