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Standard Test Method for Determining the Yield of Wide Inked Computer Ribbons
WITHDRAWN published on 10.9.1995
Selected format:Standard Test Method for Determining the Yield of Wide Inked Computer Ribbons (Withdrawn 2015)
WITHDRAWN published on 1.1.2008
Selected format:Standard Test Method for Measuring Flatness, Thickness, and Thickness Variation on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003)
WITHDRAWN published on 10.12.2002
Selected format:Standard Test Method for Measuring Flatness, Thickness, and Thickness Variation on Silicon Wafers by Automated Noncontact Scanning
WITHDRAWN published on 1.1.1994
Selected format:Standard Test Method for Comparing Printer or Copier Cartridges (Withdrawn 2003)
WITHDRAWN published on 1.1.1994
Selected format:Standard Guide for Qualification, Selection, Training, Utilization, and Supervision of Security Screening Personnel (Withdrawn 2001)
WITHDRAWN published on 1.1.1994
Selected format:Standard Specification for Deformed Polyethylene (PE) Liner
WITHDRAWN published on 10.11.2001
Selected format:Standard Specification for Deformed Polyethylene (PE) Liner (Withdrawn 2018)
WITHDRAWN published on 1.12.2009
Selected format:Standard Specification for Deformed Polyethylene (PE) Liner
WITHDRAWN published on 10.11.2001
Selected format:Standard Test Method for Determining Changes in Fire-Test-Response Characteristics of Cushioning Materials After Water Leaching
WITHDRAWN published on 10.9.2000
Selected format:Latest update: 2026-08-14 (Number of items: 2 293 479)
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