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Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers (Withdrawn 2003)
WITHDRAWN published on 10.5.2002
Selected format:Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers
WITHDRAWN published on 1.1.1996
Selected format:Standard Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle
WITHDRAWN published on 15.9.1995
Selected format:Standard Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle (Withdrawn 2003) (Includes all amendments And changes 8/16/2017).
WITHDRAWN published on 15.9.1995
Selected format:Standard Practice for Calibrating a Scanning Surface Inspection System Using Monodisperse Polystyrene Latex Spheres Deposited on Polished or Epitaxial Wafer Surfaces (Withdrawn 2003)
WITHDRAWN published on 1.1.1996
Selected format:Standard Practice for Determining the Positional Accuracy Capabilities of a Scanning Surface Inspection System (Withdrawn 2003)
WITHDRAWN published on 1.1.1996
Selected format:Test Method for Measuring the Torsional Properties of Metallic Bone Screws (Withdrawn 2001)
WITHDRAWN published on 1.1.2000
Selected format:Standard Terminology Relating to Thermal Imaging Products
WITHDRAWN published on 1.1.1996
Selected format:Standard Terminology Relating to Thermal Imaging Products
WITHDRAWN published on 10.1.1996
Selected format:Standard Terminology Relating to Thermal Imaging Products
WITHDRAWN published on 1.1.2008
Selected format:Latest update: 2026-08-13 (Number of items: 2 293 179)
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