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Preview ASTM F614-80(1991)e1 1.1.1991
ASTM F614-80(1991)e1 Historical

Test Method for Distortion of Optical Lenses Used in Photomask Fabrication (Includes all amendments And changes 8/13/2021).

WITHDRAWN published on 1.1.1991

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Preview ASTM F615-79(1988) 1.1.1900
ASTM F615-79(1988) Historical

Practice for Determining Safe Current Pulse Operating Regions for Metallization on Semiconductor Components (Withdrawn 1995)

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Preview ASTM F615M-95 15.5.1995 Preview of the standard
ASTM F615M-95 Historical

Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components [Metric]

WITHDRAWN published on 15.5.1995

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Preview ASTM F615M-95(2002) 15.5.1995 Preview of the standard
ASTM F615M-95(2002) Historical

Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components [Metric]

WITHDRAWN published on 15.5.1995

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Preview ASTM F615M-95(2008) 15.6.2008 Preview of the standard
ASTM F615M-95(2008) Historical

Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)

WITHDRAWN published on 15.6.2008

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Preview ASTM F615M-95(2013) 1.5.2013 Preview of the standard
ASTM F615M-95(2013) Historical

Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric) (Withdrawn 2022)

WITHDRAWN published on 1.5.2013

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Preview ASTM F616-92 1.1.1992 Preview of the standard
ASTM F616-92 Historical

Standard Test Method for Measuring MOSFET Drain Leakage Current

WITHDRAWN published on 1.1.1992

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Preview ASTM F616M-96 10.6.1996 Preview of the standard
ASTM F616M-96 Historical

Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric)

WITHDRAWN published on 10.6.1996

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Preview ASTM F616M-96(2003) 10.6.1996 Preview of the standard
ASTM F616M-96(2003) Historical

Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric) (Withdrawn 2009)

WITHDRAWN published on 10.6.1996

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Preview ASTM F617-00 10.6.2000 Preview of the standard
ASTM F617-00 Historical

Standard Test Method for Measuring MOSFET Linear Threshold Voltage (Withdrawn 2006)

WITHDRAWN published on 10.6.2000

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