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Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness.
Standard published on 27.2.2020
Selected format:Characterization of sludges. Settling properties. Determination of settleability (Determination of the proportion of sludge volume and sludge volume index).
Standard published on 30.4.2007
Selected format:Characterisation of sludges. Settling properties. Determination of thickenability.
Standard published on 30.4.2007
Selected format:Characterisation of sludges. Settling properties. Determination of zone settling velocity (ZSV).
Standard published on 5.3.2019
Selected format:Furniture. Links for non-domestic seating linked together in a row. Strength requirements and test methods.
Standard published on 31.5.2007
Selected format:Fine ceramics (advanced ceramics, advanced technical ceramics). Sample preparation for the determination of particle size distribution of ceramic powders.
Standard published on 28.2.2009
Selected format:Heat exchangers. Method of measurement and evaluation of thermal performances of wet cooling towers.
Standard published on 28.7.2005
Selected format:Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for hardness of monolithic ceramics at room temperature.
Standard published on 3.2.2021
Selected format:Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy.
Standard published on 31.7.2014
Selected format:Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use.
Standard published on 12.3.2021
Selected format:Latest update: 2026-08-10 (Number of items: 2 292 404)
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