Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave Gunn oscillators (c.w. operation).

WITHDRAWN published on 15.9.1977

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave Gunn oscillators (pulse operation).

WITHDRAWN published on 15.9.1977

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave avalanche oscillators (c.w. operation).

WITHDRAWN published on 15.10.1977

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave avalanche oscillators (pulse operation).

WITHDRAWN published on 15.10.1977

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: varactor diodes for frequency multiplication.

WITHDRAWN published on 1.12.1988

Tests for geometrical properties of aggregates. Determination of particle size distribution. Sieving method.

WITHDRAWN published on 15.3.2006

Tests for geometrical properties of aggregates. Assessment of fines. Grading of fillers (air-jet sieving).

WITHDRAWN published on 15.5.2001

Tests for geometrical properties of aggregates. Determination of particle size distribution. Test sieves, nominal size of apertures.

WITHDRAWN published on 15.6.1996

Tests for geometrical properties of aggregates. Determination of particle shape. Flakiness index.

WITHDRAWN published on 26.2.2004

Tests for geometrical properties of aggregates. Determination of particle shape. Shape index.

WITHDRAWN published on 15.1.2000