Tests for geometrical properties of aggregates. Determination of percentage of crushed and broken surfaces in coarse aggregate particles.

WITHDRAWN published on 11.5.2005

Tests for geometrical properties of aggregates. Assessment of surface characteristics. Flow coefficient of aggregates.

WITHDRAWN published on 18.8.2004

Tests for geometrical properties of aggregates. Assessment of surface characteristics. Flow coefficient of aggregates.

WITHDRAWN published on 30.4.2014

Tests for geometrical properties of aggregates. Assessment of fines. Sand equivalent test.

WITHDRAWN published on 15.7.1999

Tests for geometrical properties of aggregates. Assessment of fines. Methylene blue test.

WITHDRAWN published on 15.4.1999

Tests for geometrical properties of aggregates. Assessment of fines. Methylene blue test.

WITHDRAWN published on 30.4.2013

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: low current rectifier diodes (up to 3 ampere rating).

WITHDRAWN published on 30.9.1969

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: medium current rectifier diodes (1-100 ampere rating).

WITHDRAWN published on 30.9.1969

Detail specification for medium current rectifier diodes. 3 A, 300 V, 600 V, 900 V, 1200 V, hermetically sealed. Full assessment level.

WITHDRAWN published on 15.6.1974

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high current rectifier diodes (greater than 50 ampere rating).

WITHDRAWN published on 29.5.1970