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BSi – The company, BSI British Standards, is a national standards body of the United Kingdom (NBS) and it was actually the very first one in the world. It represents national and social interests of Great Britain in all European and international standardization organizations and in the development of business information of British institutions of all sizes and sectors. BSI British Standards cooperates with manufacturing and service industries, various companies, the government and with consumers as well in order to facilitate the production of British, European and international standards. A part of BSI Group, BSI British Standards, works closely with the government of the United Kingdom, especially in the Department for Innovations, Universities and Skills (DIUS).
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness.
Standard published on 27.2.2020
Selected format:Characterization of sludges. Settling properties. Determination of settleability (Determination of the proportion of sludge volume and sludge volume index).
Standard published on 30.4.2007
Selected format:Characterisation of sludges. Settling properties. Determination of thickenability.
Standard published on 30.4.2007
Selected format:Characterisation of sludges. Settling properties. Determination of zone settling velocity (ZSV).
Standard published on 5.3.2019
Selected format:Furniture. Links for non-domestic seating linked together in a row. Strength requirements and test methods.
Standard published on 31.5.2007
Selected format:Fine ceramics (advanced ceramics, advanced technical ceramics). Sample preparation for the determination of particle size distribution of ceramic powders.
Standard published on 28.2.2009
Selected format:Heat exchangers. Method of measurement and evaluation of thermal performances of wet cooling towers.
Standard published on 28.7.2005
Selected format:Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for hardness of monolithic ceramics at room temperature.
Standard published on 3.2.2021
Selected format:Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy.
Standard published on 31.7.2014
Selected format:Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use.
Standard published on 12.3.2021
Selected format:Latest update: 2026-07-14 (Number of items: 2 286 733)
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