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Standards BS - British national standards - Page 7848
BSi – The company, BSI British Standards, is a national standards body of the United Kingdom (NBS) and it was actually the very first one in the world. It represents national and social interests of Great Britain in all European and international standardization organizations and in the development of business information of British institutions of all sizes and sectors. BSI British Standards cooperates with manufacturing and service industries, various companies, the government and with consumers as well in order to facilitate the production of British, European and international standards. A part of BSI Group, BSI British Standards, works closely with the government of the United Kingdom, especially in the Department for Innovations, Universities and Skills (DIUS).
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BS EN 60749-34:2004
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Semiconductor devices. Mechanical and climatic test methods. Power cycling.
WITHDRAWN published on 22.6.2004
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BS EN 60749-37:2008
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Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using an accelerometer.
WITHDRAWN published on 30.5.2008
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BS EN 60749-39:2006
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Semiconductor devices. Mechanical and climatic test methods. Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components.
WITHDRAWN published on 29.12.2006
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BS EN 60749-4:2002
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Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST).
WITHDRAWN published on 10.9.2002
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BS EN 60749-43:2017
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Semiconductor devices - Mechanical and climatic test methods. Guidelines for IC reliability qualification plans.
WITHDRAWN published on 22.9.2017
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BS EN 60749-5:2003
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Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test.
WITHDRAWN published on 18.6.2003
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BS EN 60749-5:2017
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Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test.
WITHDRAWN published on 20.7.2017
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BS EN 60749-5:2017-TC
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Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test.
WITHDRAWN published on 27.2.2020
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BS EN 60749-6:2002
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Semiconductor devices. Mechanical and climatic test methods. Storage at high temperature.
WITHDRAWN published on 10.9.2002
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BS EN 60749-7:2002
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Semiconductor devices. Mechanical and climatic test methods. Internal moisture content measurement and the analysis of other residual gases.
WITHDRAWN published on 17.9.2002
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