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Standards BS - British national standards - Page 7847
BSi – The company, BSI British Standards, is a national standards body of the United Kingdom (NBS) and it was actually the very first one in the world. It represents national and social interests of Great Britain in all European and international standardization organizations and in the development of business information of British institutions of all sizes and sectors. BSI British Standards cooperates with manufacturing and service industries, various companies, the government and with consumers as well in order to facilitate the production of British, European and international standards. A part of BSI Group, BSI British Standards, works closely with the government of the United Kingdom, especially in the Department for Innovations, Universities and Skills (DIUS).
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BS EN 60749-18:2003
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Semiconductor devices. Mechanical and climatic test methods. Ionizing radiation (total dose).
WITHDRAWN published on 7.7.2004
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BS EN 60749-20:2003
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Semiconductor devices. Mechanical and climatic test methods. Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat.
WITHDRAWN published on 7.7.2003
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BS EN 60749-20:2009
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Semiconductor devices. Mechanical and climatic test methods. Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat.
WITHDRAWN published on 31.1.2010
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BS EN 60749-21:2005
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Semiconductor devices. Mechanical and climatic test methods. Solderability.
WITHDRAWN published on 5.12.2005
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BS EN 60749-26:2006
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Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM).
WITHDRAWN published on 29.9.2006
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BS EN 60749-26:2014
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Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM).
WITHDRAWN published on 30.6.2014
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BS EN 60749-28:2017
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Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level.
WITHDRAWN published on 10.7.2017
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BS EN 60749-29:2003
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Semiconductor devices. Mechanical and climatic test methods. Latch-up test.
WITHDRAWN published on 29.6.2004
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BS EN 60749-3:2002
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Semiconductor devices. Mechanical and climatic test methods. External visual examination.
WITHDRAWN published on 17.9.2002
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BS EN 60749-30:2005+A1:2011
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Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing.
WITHDRAWN published on 30.9.2011
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