Semiconductor devices--Part 12-4:Optoelectronicdevices--Blank detail specification for pin-FET modules with/without pigtailfor fiber optic systems or sub-systems

Standard published on 4.12.2002

Semiconductor devices--Part 12-5: Optoelectronic devices--Blank detail specification for pin-photodiodes with/without pigtailfor fibre optic systems or subsystems

Standard published on 24.1.2003

Software engineering--Product evaluation--Part 6:Documentation of evaluation modules

Standard published on 4.12.2002

Open electronic-book publication structure

Standard published on 4.12.2002

Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope

Standard published on 19.7.2013

Specified time relays for industrial use--Part 1:Requirements and tests

Standard published on 4.12.2002

Sectional specification for high-frequency inductors and intermediate frequency transformers for use in electronic equipment for capability approval

Standard published on 4.12.2002

Liquid crystal display devices—Part 10-1: Environmental, endurance and mechanical test methods—Mechanical

Standard published on 11.10.2021

Liquid crystal display devices—Part 10-2: Environmental, endurance and mechanical test methods—Environmental and endurance

Standard published on 11.10.2021

Liquid crystal display devices—Part 10-3Environmental, endurance and mechanical test methods—Glass strength and reliability

Standard published on 25.4.2025