Performance requirements and test methods for UHF measuring distance equipment(MDE)

Standard published on 4.12.2002

Information technology--Quality of service:Framework

Standard published on 4.12.2002

Semiconductor devices--Part 12-1:Optoelectronic devices--Blank detail specification for light emitting/infrared emitting diodes with/without pigtail for fiber optic systems or sub-systems

Standard published on 4.12.2002

Semiconductor devices--Part 12-2:Optoelectronic devices--Blank detail specification for laser diodes modules with pigtail for fiber optic systems or sub-systems

Standard published on 4.12.2002

Semiconductor devices--Part 12-3:Optoelectronic devices--Blank detail specification for light-emitting diodes--Display application

Standard published on 6.12.1990

Semiconductor devices--Part 12-4:Optoelectronicdevices--Blank detail specification for pin-FET modules with/without pigtailfor fiber optic systems or sub-systems

Standard published on 4.12.2002

Semiconductor devices--Part 12-5: Optoelectronic devices--Blank detail specification for pin-photodiodes with/without pigtailfor fibre optic systems or subsystems

Standard published on 24.1.2003

Software engineering--Product evaluation--Part 6:Documentation of evaluation modules

Standard published on 4.12.2002

Open electronic-book publication structure

Standard published on 4.12.2002

Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope

Standard published on 19.7.2013