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Harmonic drive reducers
Execute Date: april 2027
Standard published on 28.9.2026
Selected format:Blankdetail specification for semiconductor inte-grated circuit fusible-link programmable bipolar read-only memories
Standard published on 21.1.1993
Selected format:Mechanical shock - Testing machines - Characteristics and performance
Standard published on 5.11.2012
Selected format:Mechanical vibration and shock—Vibration of fixed structures—Guidelines for the measurement of vibrations and evaluation of their effects on structures
Standard published on 31.12.2024
Selected format:Series 1 freight containers—Classification,dimensions and ratings
Standard published on 17.3.2023
Selected format:Silicon epitaxial wafers
Standard published on 4.6.2019
Selected format:General purpose metric screw threads - The plan for pipe systems
Standard published on 9.6.2013
Selected format:Test method for measuring diameter of semiconductor wafer
Standard published on 1.8.2025
Selected format:Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array
Standard published on 30.10.2009
Selected format:Latest update: 2026-11-03 (Number of items: 2 209 039)
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