Standards GB - Chinese national standards - Page 4188

Semiconductor devices—Micro-electromechanical devices—Part 40: Test methods of MEMS inertial shock switch threshold
Execute Date: february 2027

Standard published on 30.7.2026

Semiconductor devices—Micro-electromechanical devices—Part 5: RF MEMS switches

Standard published on 23.5.2023

Semiconductor devices—Micro-electromechanical devices—Part 6: Axial fatigue testing methods of thin film materials
Execute Date: february 2027

Standard published on 30.7.2026

Semiconductor devices—Micro-electromechanical devices—Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

Standard published on 23.5.2023

Semiconductor devices—Micro-electromechanical devices—Part 8: Strip bending test method for tensile property measurement of thin films
Execute Date: february 2027

Standard published on 30.7.2026

Test methods for the performance of solar collectors

Standard published on 31.12.2021

Direct current (DC) plugs and socket-outlets for household and similar purposes—Part 1: General requirements

Standard published on 7.9.2023

Direct current (DC) plugs and socket-outlets for household and similar purposes—Part 2: Types and dimensions

Standard published on 7.9.2023

Wireless power supply in mechanical parking system—Technical requirement and testing specification

Standard published on 6.8.2023

Design principle and calibration method of Chinese dummy for mechanical damage testing

Standard published on 6.8.2023