We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Standards GB are Chinese national standards, which are issued by China's Standardization Administration Office (SAC).
Chinese national standards are used all over China commonly labeled as GB standards. They determine the united production requirements regarding product safety and quality .
GB standards are often modified or created according to the international standards of ISO, IEC or any other international level.
Although, they are largely harmonized, GB standards may differ from international standards .
Approximately 15% of all GB standards are obligatory and they can be identified according to the prefix GB, after which the code of the standards follows:
GB – Obligatory national standards
GB/T – Optional national standards
GB/Z – National steering technical document
Semiconductor devices—Bias-temperature instability test for metal-oxide semiconductor field-effect transistors (MOSFETs)—Part 1: Fast bias-temperature instability test for MOSFETs
Standard published on 30.4.2026
Selected format:Information technology—Software measurement—Software quality measurement—Automated source code quality measures
Standard published on 30.5.2025
Selected format:Semiconductor devices—Time dependent dielectric breakdown (TDDB) test for inter-metal layers
Standard published on 30.5.2025
Selected format:Semiconductor devices—Hot carrier test on metal-oxide semiconductor(MOS) transistors
Standard published on 30.5.2025
Selected format:Semiconductor devices—Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Standard published on 30.5.2025
Selected format:Semiconductor devices—Stress migration test—Part 1: Copper stress migration test
Standard published on 30.5.2025
Selected format:Semiconductor devices—Constant current electromigration test
Standard published on 30.5.2025
Selected format:Test method for printed board—Monitoring of single plated-through hole(PTH) resistance change during temperature cycling
Standard published on 30.5.2025
Selected format:Design methods for satellite-earth data transmission link of remote sensing satellites
Standard published on 30.5.2025
Selected format:Visible to short-wave infrared spectral reflectance measurement of crops
Standard published on 30.5.2025
Selected format:Latest update: 2026-11-11 (Number of items: 2 209 289)
© Copyright 2026 NORMSERVIS s.r.o.