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Standards GB - Chinese national standards - Page 4731
Standards GB are Chinese national standards, which are issued by China's Standardization Administration Office (SAC).
Chinese national standards are used all over China commonly labeled as GB standards. They determine the united production requirements regarding product safety and quality .
GB standards are often modified or created according to the international standards of ISO, IEC or any other international level.
Although, they are largely harmonized, GB standards may differ from international standards .
Approximately 15% of all GB standards are obligatory and they can be identified according to the prefix GB, after which the code of the standards follows:
GB – Obligatory national standards
GB/T – Optional national standards
GB/Z – National steering technical document
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GB/T 4934.1-2008
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Instrument for soil test - Shear apparatus - Part 1: Strain-controlled direct shear apparatus
Standard published on 17.6.2008
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GB/T 4934.2-2008
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Instrument for soil test - Shear apparatus - Part 2Field vane shear apparatus
Standard published on 17.6.2008
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GB/T 4935.1-2008
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Instrument for soil test - Oedometer - Part 1: Single level arm oedometer
Standard published on 21.11.2008
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GB/T 4935.2-2009
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Instrument for soil test - Oedometer - Part 2: Pneumatic oedometer
Standard published on 12.6.2009
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GB/T 4937.1-2006
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Semiconductor devicesMechanical and climatic test methodsPart 1: General
Standard published on 23.8.2006
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GB/T 4937.10-2025
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Semiconductor devices—Mechanical and climatic test methods—Part 10: Mechanical shock—Device and subassembly
Standard published on 31.12.2025
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GB/T 4937.11-2018
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Semiconductor devices—Mechanical and climatic test methods—Part 11:Rapid change of temperature—Two-fluid-bath method
Standard published on 17.9.2018
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GB/T 4937.12-2018
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Semiconductor devices—Mechanical and climatic test methods—Part 12: Vibration, variable frequency
Standard published on 17.9.2018
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GB/T 4937.13-2018
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Semiconductor devices—Mechanical and climatic test methods—Part 13: Salt atmosphere
Standard published on 17.9.2018
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GB/T 4937.14-2018
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Semiconductor devices—Mechanical and climatic test methods—Part 14: Robustness of terminationslead integrity
Standard published on 17.9.2018
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