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DIN - German national standards - Page 17636

Standards DIN - German national standards - Page 17636

DIN is a protected designation of German national technical standards.

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Preview DIN 6353:1977-04 1.4.1977
DIN 6353:1977-04 WITHDRAWN

Lathe Chucks, Power-operated, without Trough-hole.
(Drehfutter, kraftbetätigt, ohne Durchlaß.)

WITHDRAWN published on 1.4.1977

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IN STOCK
Preview E DIN 6353:2006-10 1.10.2006
E DIN 6353:2006-10 WITHDRAWN

Lathe chucks, power-operated, without trough-hole - Cross tenon type jaw mounting.
(Drehfutter, kraftbetätigt, ohne Durchlass - Spannbackenaufnahme nach Art des Kreuzversatzes.)

WITHDRAWN published on 1.10.2006

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Preview DIN 6354:1979-08 1.8.1979
DIN 6354:1979-08 WITHDRAWN

Milling machine arbors with steep taper, complete.
(Fräserdorne mit Steilkegel, vollständig.)

WITHDRAWN published on 1.8.1979

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Preview E DIN EN IEC 63550-1:2026-05 1.5.2026
E DIN EN IEC 63550-1:2026-05 WITHDRAWN

VDE 0884-3550-1. Semiconductor devices - Neuromorphic devices - Part 1: Evaluation method of basic characteristics in memristor devices.
(VDE 0884-3550-1. Halbleiterbauelemente - Neuromorphe Bauelemente - Teil 1: Bewertungsverfahren für grundlegende Eigenschaften in Memristor-Bauelementen.)

WITHDRAWN published on 1.5.2026

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Immediately after publication
Preview E DIN EN IEC 63550-2:2026-05 1.5.2026
E DIN EN IEC 63550-2:2026-05 WITHDRAWN

VDE 0884-3550-2. Semiconductor devices - Neuromorphic devices - Part 2: Evaluation method of linearity in memristor devices.
(VDE 0884-3550-2. Halbleiterbauelemente - Neuromorphe Bauelemente - Teil 2: Bewertungsmethode für die Linearität in Memristor-Bauelementen.)

WITHDRAWN published on 1.5.2026

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Preview E DIN EN IEC 63550-3:2026-05 1.5.2026
E DIN EN IEC 63550-3:2026-05 WITHDRAWN

VDE 0884-3550-3. Semiconductor devices - Neuromorphic devices - Part 3: Evaluation method of spike dependent plasticity in memristor devices.
(VDE 0884-3550-3. Halbleiterbauelemente - Neuromorphe Bauelemente - Teil 3: Bewertungsmethode für spikeabhängige Plastizität in Memristor-Bauelementen.)

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Preview E DIN EN IEC 63550-4:2026-05 1.5.2026
E DIN EN IEC 63550-4:2026-05 WITHDRAWN

VDE 0884-3550-4. Semiconductor devices - Neuromorphic devices - Part 4: Evaluation method of asymmetry in memristor devices.
(VDE 0884-3550-4. Halbleiterbauelemente - Neuromorphe Bauelemente - Teil 4: Bewertungsmethode für Asymmetrien in Memristor-Bauelementen.)

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Immediately after publication
Preview DIN 6356:1972-05 1.5.1972
DIN 6356:1972-05 WITHDRAWN

Centering arbors for milling cutters.
(Zentrierdorne für Messerköpfe mit Innenzentrierung.)

WITHDRAWN published on 1.5.1972

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IN STOCK
Preview E DIN EN IEC 63563-4:2026-05 1.5.2026
E DIN EN IEC 63563-4:2026-05 WITHDRAWN

Qi Specification version 2.0 - Part 4: Power Delivery.
(Qi-Spezifikation Version 2.0 - Teil 4: Energieversorgung.)

WITHDRAWN published on 1.5.2026

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in 7 working days
Preview E DIN 6357:1971-06 1.6.1971
E DIN 6357:1971-06 WITHDRAWN

Holding arbors for milling cutters.
(Aufnahmedorne für Messerköpfe mit Innenzentrierung.)

WITHDRAWN published on 1.6.1971

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