Industrial-process measurement, control and automation - Smart manufacturing - Part 1: Terms and definitions

Standard published on 9.3.2022

Industrial-process measurement, control and automation - Smart manufacturing - Part 2: Use cases

Standard published on 23.12.2025

Industrial-process measurement, control and automation - Smart manufacturing - Part 3: Challenges for cybersecurity

Standard published on 9.3.2022

Industrial-process measurement, control and automation – Smart manufacturing – Part 5: Market and innovation trends analysis

Standard published on 20.11.2024

Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors
(Dispositifs a semiconducteurs - Methode d’essai de fiabilite par la commutation sur charge inductive pour les transistors au nitrure de gallium)

Standard published on 21.4.2022

Flexible organic light emitting diode (OLED) panels for general lighting - Performance requirements
(Panneaux a diodes electroluminescentes organiques (OLED) flexibles destines a l´eclairage general - Exigences de performance)

Standard published on 28.9.2022

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
(Dispositifs a semiconducteurs - Lignes directrices generiques concernant la qualification des semiconducteurs - Partie 1: Lignes directrices concernant la qualification de la fiabilite des circuits integres)

Standard published on 25.8.2021

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
(Dispositifs a semiconducteurs - Lignes directrices concernant les plans de qualification de la fiabilite - Partie 2: Concept de profil de mission)

Standard published on 29.3.2023

Semiconductor devices - Generic semiconductor qualification guidelines - Part 3: Guidelines for reliability qualification plans for power semiconductor module
(Dispositifs a semiconducteurs - Lignes directrices generiques concernant la qualification des semiconducteurs - Partie 3: Lignes directrices pour les plans de qualification de la fiabilite des modules a semiconducteurs de puissance)

Standard published on 6.8.2026

Semiconductor devices - Guidelines for reliability qualification plans - Part 4: Early failure assessment
(Dispositifs a semiconducteurs - Lignes directrices concernant les plans de qualification de la fiabilite - Partie 4: Evaluation des defaillances precoces)

Standard published on 28.8.2026