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Standards IEC - International electro-technical commission - Page 795
IEC – The company IEC is world-leading organization, which creates and issues International standards for all electrical, electronic and other related technologies known generally as electro-technologies. Wherever, there is electricity and electronics you can find the company IEC, which promotes the safety and performance, the environment, electrical energy efficiency and renewable energy. The company IEC also administers conformity assessment systems, which certify that the equipment, systems or components comply with International Standards of this company.
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IEC 62047-40-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold
Standard published on 3.9.2021
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IEC 62047-41-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 41: RF MEMS circulators and isolators
(Dispositifs a semiconducteurs - Dispositifs microelectromecaniques - Partie 41: Circulateurs et isolateurs a MEMS RF)
Standard published on 15.6.2021
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IEC 62047-42-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 42: Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
Standard published on 16.9.2022
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IEC 62047-43-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices
Standard published on 19.3.2024
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IEC 62047-44-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 44: Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
Standard published on 22.2.2024
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IEC 62047-45-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 45: Silicon based MEMS fabrication technology - Measurement method of impact resistance of nanostructures
Standard published on 20.3.2025
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IEC 62047-46-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 46: Silicon based MEMS fabrication technology - Measurement method of tensile strength of nanoscale thickness membrane
Standard published on 23.4.2025
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IEC 62047-47-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 47: Silicon based MEMS fabrication technology - Measurement method of bending strength of microstructures
Standard published on 23.8.2024
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IEC 62047-48-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 48: Test method for determining solution concentration by optical absorption using MEMS fluidic device
Standard published on 7.6.2024
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IEC 62047-5-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
(Dispositifs a semiconducteurs - Dispositifs microelectromecaniques - Partie 5: Commutateurs MEMS-RF)
Standard published on 13.7.2011
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