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Standards JIS - Japanese technical standards - Page 334
JIS covers industrial and mineral products, comparable to standards established by various industrial associations for specific needs, or standards established and used by companies (operation manuals, products specifications etc.). The need for common practices in companies of the same industrial sector leads to the establishment of industrial association standards, and the same need in terms of wider applications promotes the establishment of JIS.
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JIS C5402-4-1:2005
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Connectors for electronic equipment -- Tests and measurements -- Part 4-1: Voltage stress tests -- Test 4a: Voltage proof
Standard published on 20.12.2005
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JIS C5402-4-2:2005
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Connectors for electronic equipment -- Tests and measurements -- Part 4-2: Voltage stress tests -- Test 4b: Partial discharge
Standard published on 20.3.2005
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JIS C5402-4-3:2005
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Connectors for electronic equipment -- Tests and measurements -- Part 4-3: Voltage stress tests -- Test 4c: Voltage proof of pre-insulated crimp barrels
Standard published on 20.3.2005
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JIS C5402-5-1:2005
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Connectors for electronic equipment -- Tests and measurements -- Part 5-1: Current-carrying capacity tests -- Test 5a: Temperature rise
Standard published on 20.3.2005
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JIS C5402-5-2:2005
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Connectors for electronic equipment -- Tests and measurements -- Part 5-2: Current-carrying capacity tests -- Test 5b: Current-temperature derating
Standard published on 20.3.2005
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JIS C5402-6-1:2005
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Connectors for electronic equipment -- Tests and measurements -- Part 6-1: Dynamic stress tests -- Test 6a: Acceleration, steady state
Standard published on 20.3.2005
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JIS C5402-6-2:2005
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Connectors for electronic equipment -- Tests and measurements -- Part 6-2: Dynamic stress tests -- Test 6b: Bump
Standard published on 20.3.2005
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JIS C5402-6-3:2005
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Connectors for electronic equipment -- Tests and measurements -- Part 6-3: Dynamic stress tests -- Test 6c: Shock
Standard published on 20.3.2005
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JIS C5402-6-4:2005
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Connectors for electronic equipment -- Tests and measurements -- Part 6-4: Dynamic stress tests -- Test 6d: Vibration (sinusoidal)
Standard published on 20.3.2005
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JIS C5402-7-1:2016
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Connectors for electronic equipment -- Tests and measurements -- Part 7-1: Impact tests (free connectors) -- Test 7a: Free fall (repeated)
Standard published on 22.3.2016
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