Standards JIS - Japanese technical standards - Page 336

Semiconductor devices -- Micro-electromechanical devices -- Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film

Standard published on 23.3.2020

Semiconductor devices -- Micro-electromechanical devices -- Part 6: Axial fatigue testing methods of thin film materials

Standard published on 22.8.2011

Dependability management -- Part 3-1: Application guide -- Analysis techniques for dependability -- Guide on methodology

Standard published on 20.11.2006

Dependability management -- Part 3-2: Application guide -- Collection of dependability data from the field

Standard published on 20.3.2008

Dependability management -- Part 3-3: Application guide -- Life cycle costing

Standard published on 20.3.2008

Dependability management -- Part 3-4: Application guide -- Specification of dependability requirements

Standard published on 21.8.2023

Dependability management -- Part 3-5: Application guide -- Reliability test conditions and statistical test principles

Standard published on 25.3.2006

Dependability management -- Part 4-1: Application guide -- Dependability of products containing reused parts -- Requirements for functionality and test

Standard published on 20.3.2008

Dependability management -- Part 4-3: Analysis techniques for system reliability -- Failure modes and effects analysis (FMEA and FMECA)

Standard published on 20.8.2021

Dependability management -- Part 4-4: Analysis techniques for system reliability -- Fault Tree Analysis (FTA)

Standard published on 20.1.2011