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STN IEC 61070 (010646)
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Compliance test procedures for steady-state availability
Standard published on 1.10.1999
Selected format: Slovak - Print design (ON REQUEST)
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STN EN 61164 (010647)
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Reliability growth - Statistical test and estimation methods
Standard published on 1.9.2004
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STN EN 62429 (010647)
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Reliability growth - Stress testing for early failures in unique complex systems
Standard published on 1.11.2008
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STN IEC 61164 (010647)
WITHDRAWN
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Reliability growth. Statistical tests and estimation methods
WITHDRAWN published on 1.7.1999
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STN EN 62550 (010648)
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Spare parts provisioning
Standard published on 1.12.2017
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STN EN 61709 (010649)
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Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
Standard published on 1.12.2017
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STN EN 62435-1 (010649)
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Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
Standard published on 1.10.2017
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STN EN 62435-2 (010649)
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Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
Standard published on 1.10.2017
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STN EN 61709 (010649)
WITHDRAWN
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Electronic components. Reliability. Reference conditions for failure rates and stress models for conversion
WITHDRAWN published on 1.10.2001
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STN EN 61709 (010649)
WITHDRAWN
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Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
WITHDRAWN published on 1.4.2012
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