ASTM E1426-98(2009)e1

Standard Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress (Includes all amendments And changes 2/27/2015).

Automatically translated name:

Standard Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress



STANDARD published on 1.6.2009


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The information about the standard:

Designation standards: ASTM E1426-98(2009)e1
Note: WITHDRAWN
Publication date standards: 1.6.2009
SKU: NS-41723
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM E1426-98(2009)e1 :

Keywords:
elastic parameter, residual stress, x-ray diffraction, Crystal lattice structure, Effective elastic parameter (Eeff), Macroscopic analysis, Polycrystalline materials, Residual stress, Stress--metallic materials, X-ray diffraction analysis, ICS Number Code 71.040.50 (Physicochemical methods of analysis)

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