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ASTM F1262M-14
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)
Automatically translated name:
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
STANDARD published on 1.6.2014
The information about the standard:
Designation standards: ASTM F1262M-14
Note: WITHDRAWN
Publication date standards: 1.6.2014
SKU: NS-49669
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: American technical standard
Category: Technical standards ASTM
Annotation of standard text ASTM F1262M-14 :
Keywords:
digital integrated circuits, digital IC´s, functional errors, ionizing, pulsed radiation, radiation, transient radiation, upset threshold, ICS Number Code 031.200 ()
Additional information
| Significance and Use | ||||||||||
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5.1 Digital logic circuits are used in system applications where they are exposed to pulses of radiation. It is important to know the minimum radiation level at which transient failures can be induced, since this affects system operation. |
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| 1. Scope | ||||||||||
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1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (matl.)/s. 1.1.1 Discussion—This document is intended to be a guide to determine upset threshold, and is not intended to be a stand-alone document. 1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. |
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| 2. Referenced Documents | ||||||||||
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