ASTM F744M-16

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)

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STANDARD published on 1.5.2016


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The information about the standard:

Designation standards: ASTM F744M-16
Note: WITHDRAWN
Publication date standards: 1.5.2016
SKU: NS-638542
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM

The category - similar standards:

Integrated circuits. Microelectronics

Annotation of standard text ASTM F744M-16 :

Keywords:
DIC, digital integrated circuits, dose rate, ionizing radiation, radiation dose rate, threshold for upset, upset ,, ICS Number Code 31.200 (Integrated circuits. Microelectronics)



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