ČSN EN IEC 60749-20-ed.3 (358799)

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

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STANDARD published on 1.4.2021


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The information about the standard:

Designation standards: ČSN EN IEC 60749-20-ed.3
Classification mark: 358799
Catalog number: 512277
Publication date standards: 1.4.2021
SKU: NS-1020946
The number of pages: 40
Approximate weight : 120 g (0.26 lbs)
Country: Czech technical standard
Category: Technical standards ČSN

The category - similar standards:

Semiconductor devices in general

Annotation of standard text ČSN EN IEC 60749-20-ed.3 (358799):

Tato norma poskytuje prostředky pro hodnocení odolnosti proti teplu při pájení uzavřených polovodičů, jako jsou v plastu zapouzdřené součástky pro povrchovou montáž (SMD). Tato zkouška je destruktivní

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